Oxidative coupling of lithium silenolates: First synthesis of bis(acyl)-substituted polysilanes

Organometallics

Volumn 15, Issue 9, 1996, Pages 2198-2200

  Ohshita, Joji ^a   Masaoka, Shin ^a   Ishikawa, Mitsuo ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001139197     PISSN: 02767333     EISSN: None     Source Type: Journal    
DOI: 10.1021/om960048e     Document Type: Article

References (17)

1. Brook, A. G. In The Chemistry of Organic Silicon Compounds; Patai, S., Rappoport, Z., Eds.; Wiley: New York, 1989; Part 2, Chapter 15.
2. (a) Brook, A. G.; Harris, J. W.; Lennon, J.; El Sheikh, M. J. Am. Chem. Soc. 1979, 101, 83.
3. (b) Ohshita, J.; Hasebe, H.; Masaoka, Y.; Ishikawa, M. Organometallics 1994, 13, 1064.
4. (c) Ishikawa, M.; Matsui, S.; Naka, A.; Ohshita, J. Main Group Chem., in press.
5. (a) Ohshita, J.; Masaoka, Y.; Ishikawa, M. Organometallics 1991, 10, 3775.
6. (b) Ohshita, J.; Masaoka, Y.; Ishikawa, M.; Takeuchi, T. Organometallics 1993, 12, 876.
7. (a) Ohshita, J.; Masaoka, Y.; Masaoka, S.; Ishikawa, M.; Tachibana, A.; Yano, T.; Yamabe, T. J. Organomet. Chem. 1994, 473, 15.
8. (b) Ohshita, J.; Masaoka, S.; Masaoka, Y.; Hasebe, H.; Ishikawa, M.; Tachibana, A.; Yano, T.; Yamabe, T. Submitted for publication in Organometallics.
9. 6: C, 59.74; H, 9.09. Found: 59.72; H, 9.01.
10. 6: C, 60.46; H, 9.85. Found: 60.30; H, 9.84.
11. 6: C, 50.90; H, 10.48. Found: 50.90; H, 10.36.
12. -1. All unique diffraction maxima with 0 < 2θ < 126.0° were recorded on a Rigaku AFC-6C automated four-circle diffractometer using graphite-monochromated Cu Kα radiation (λ = 1.5418 Å). The structures were solved by Monte-Carlo direct methods (Furusaki, A. Acta Crystallogr., Sect. A 1979, 35, 220) using the MULTAN 78 program system (Main, P.; Hull, S. E.; Lessinger, L.; Germain, G.; Declarcq, J.-P.; Woolfson, M. MULTAN78, A System of Computer Programs for the Automatic Solution of Crystal Structures from X-Ray Difraction Data, Univ. of York, England, and Louvain, Belgium, 1978) and refined by the full-matrix least-squares program (Katayama, C.; Sakabe, N.; Sakabe, K. Acta Crystallogr., Sect. A 1972, 28, S207). Atomic scattering factors were taken from: International Tables for X-ray Crystallography; Kynoch Press: Birmingham, U.K., 1974; Vol. 4. Anisotropic temperature factors were used for refinement of non-hydrogen atoms. All computations were performed on the HITAC M-680/180E system at the Information Processing Center of Hiroshima University using the CRYSTAN program system (Katayama, C.; Honda, M. CRYSTAN, The Computer Center of Nagoya University Library Program).
13. -1. All unique diffraction maxima with 0 < 2θ < 126.0° were recorded on a Rigaku AFC-6C automated four-circle diffractometer using graphite-monochromated Cu Kα radiation (λ = 1.5418 Å). The structures were solved by Monte-Carlo direct methods (Furusaki, A. Acta Crystallogr., Sect. A 1979, 35, 220) using the MULTAN 78 program system (Main, P.; Hull, S. E.; Lessinger, L.; Germain, G.; Declarcq, J.-P.; Woolfson, M. MULTAN78, A System of Computer Programs for the Automatic Solution of Crystal Structures from X-Ray Difraction Data, Univ. of York, England, and Louvain, Belgium, 1978) and refined by the full-matrix least-squares program (Katayama, C.; Sakabe, N.; Sakabe, K. Acta Crystallogr., Sect. A 1972, 28, S207). Atomic scattering factors were taken from: International Tables for X-ray Crystallography; Kynoch Press: Birmingham, U.K., 1974; Vol. 4. Anisotropic temperature factors were used for refinement of non-hydrogen atoms. All computations were performed on the HITAC M-680/180E system at the Information Processing Center of Hiroshima University using the CRYSTAN program system (Katayama, C.; Honda, M. CRYSTAN, The Computer Center of Nagoya University Library Program).
14. -1. All unique diffraction maxima with 0 < 2θ < 126.0° were recorded on a Rigaku AFC-6C automated four-circle diffractometer using graphite-monochromated Cu Kα radiation (λ = 1.5418 Å). The structures were solved by Monte-Carlo direct methods (Furusaki, A. Acta Crystallogr., Sect. A 1979, 35, 220) using the MULTAN 78 program system (Main, P.; Hull, S. E.; Lessinger, L.; Germain, G.; Declarcq, J.-P.; Woolfson, M. MULTAN78, A System of Computer Programs for the Automatic Solution of Crystal Structures from X-Ray Difraction Data, Univ. of York, England, and Louvain, Belgium, 1978) and refined by the full-matrix least-squares program (Katayama, C.; Sakabe, N.; Sakabe, K. Acta Crystallogr., Sect. A 1972, 28, S207). Atomic scattering factors were taken from: International Tables for X-ray Crystallography; Kynoch Press: Birmingham, U.K., 1974; Vol. 4. Anisotropic temperature factors were used for refinement of non-hydrogen atoms. All computations were performed on the HITAC M-680/180E system at the Information Processing Center of Hiroshima University using the CRYSTAN program system (Katayama, C.; Honda, M. CRYSTAN, The Computer Center of Nagoya University Library Program).
15. -1. All unique diffraction maxima with 0 < 2θ < 126.0° were recorded on a Rigaku AFC-6C automated four-circle diffractometer using graphite-monochromated Cu Kα radiation (λ = 1.5418 Å). The structures were solved by Monte-Carlo direct methods (Furusaki, A. Acta Crystallogr., Sect. A 1979, 35, 220) using the MULTAN 78 program system (Main, P.; Hull, S. E.; Lessinger, L.; Germain, G.; Declarcq, J.-P.; Woolfson, M. MULTAN78, A System of Computer Programs for the Automatic Solution of Crystal Structures from X-Ray Difraction Data, Univ. of York, England, and Louvain, Belgium, 1978) and refined by the full-matrix least-squares program (Katayama, C.; Sakabe, N.; Sakabe, K. Acta Crystallogr., Sect. A 1972, 28, S207). Atomic scattering factors were taken from: International Tables for X-ray Crystallography; Kynoch Press: Birmingham, U.K., 1974; Vol. 4. Anisotropic temperature factors were used for refinement of non-hydrogen atoms. All computations were performed on the HITAC M-680/180E system at the Information Processing Center of Hiroshima University using the CRYSTAN program system (Katayama, C.; Honda, M. CRYSTAN, The Computer Center of Nagoya University Library Program).
16. Sheldrick, W. S. In The Chemistry of Organic Silicon Compounds; Patai, S., Rappoport, Z., Eds.; Wiley: New York, 1989; Part 1, Chapter 3.
17. 5: C, 61.58; H, 8.96. Found: 61.65; H, 8.91.