Trace copper measurements and electrical effects in LPE HgCdTe

Journal of Electronic Materials

Volumn 25, Issue 8, 1996, Pages 1183-1187

  Tower, J P ^a   Tobin, S P ^a   Norton, P W ^a   Bollong, A B ^b   Socha, A ^b   Tregilgas, J H ^c   Ard, C K ^d   Arlinghaus, H F ^e  

^a Loral Infrared and Imaging Systems   (United States)

^b Johnson Matthey Electronics   (United States)

^c TEXAS INSTRUMENTS   (United States)

^d II VI Inc   (United States)

^e Atom Sciences   (United States)

Author keywords

CdZnTe; HgCdTe; Sputter initiated resonance ionization spectroscopy (SIRIS); Trace impurities

Indexed keywords

EID: 0001126998     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02655006     Document Type: Article

References (13)

1. M.G. Astles, H. Hill, G. Blackmore, S. Courtney and N. Shaw, J. Cryst. Growth 91, 1 (1988).
2. P. Rudolph, M. Muhlberg, M. Neubert, T. Boeck, P. Mock, L. Parthier, K. Jacobs and E. Kropp, J. Cryst. Growth 118, 204 (1992).
3. J.P. Tower, S.P. Tobin, M. Kestigian, P.W. Norton, A.B. Bollong, H.F. Schaake and C.K. Ard, J. Electron. Mater. 24 (5), 497 (1995).
4. T.H. Myers, K.A. Harris, R.W. Yanka, L.M. Mohnkern, R.J. Williams and G.K. Dudoff, J. Vac. Sci. Technol. B 10, 1438 (1992).
5. R. Korenstein, R J. Olson, Jr., D. Lee, P.K. Liao and C.A. Castro, J. Electron. Mater. 24 (5), 511 (1995).
6. S. Sen, J.E. Stannard, S.M. Johnson, H.F. Arlinghaus and G.I. Bekov, J. Electron, Mater. 24 (5), 515 (1995).
7. G.N. Pultz, P.W. Norton, E.E. Krueger and M.B. Reine, J. Vac. Sci. Technol. B 9, 1724 (1991).
8. M.C. Gold and D.A. Nelson, J. Vac. Sci. Technol. A 4, 2040 (1986).
9. H.F. Arlinghaus, M.T. Spaar and N. Thonnard, J. Vac. Sci. Technol. A 8, 2318 (1990).
10. H.F. Arlinghaus, M.T. Spaar, N. Thonnard, A.W. McMahon, T. Tanigaki, H. Shichi and P.H. Holloway, J. Vac. Sci. Technol. A 11, 2317 (1993).
11. H.F. Arlinghaus, M.T. Spaar, T. Tanigaki, A.W. McMahon and P.H. Holloway, J Vac. Sci. Technol. B 12, 263 (1994).
12. P.K. Chu, Encyclopedia of Materials Characterization, ed. C.R. Brundle, C.A. Evans and S. Wilson (Boston: Butterworth-Heinemann, 1992), p. 543.
13. K.K. Parat, N.R. Taskar, I.B. Bhat and S.K. Ghandi, J. Cryst. Growth 102, 413 (1990).