Erratum: Direct imaging of dopants in GaAs with cross-sectional scanning tunneling microscopy [Appl. Phys. Lett. 63, 2923 (1993)]

Applied Physics Letters

Volumn 64, Issue 11, 1994, Pages 1454-

  Johnson, M B ^a   Albrektsen, O ^a   Feenstra, R M ^a   Salemink, H W ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

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Indexed keywords

EID: 0001123583     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.111999     Document Type: Erratum

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