Investigation of deep levels in semi-insulating GaAs by means of the temperature change piezoelectric photo-thermal measurements

Journal of Applied Physics

Volumn 89, Issue 3, 2001, Pages 1751-1754

  Fukuyama, Atsuhiko ^a   Memon, Aftab ^a   Sakai, Kentaro ^a   Akashi, Yoshito ^a   Ikari, Tetsuo ^a  

^a UNIVERSITY OF MIYAZAKI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001109015     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1336560     Document Type: Article

References (11)

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