-
1
-
-
0029407770
-
-
J. Faist, F. Capasso, C. Sitori, D. L. Divco, A. L. Hutchinson, and A. Y. Cho, Appl. Phys. Lett. AIP 67, 3057 (1995).
-
(1995)
Appl. Phys. Lett. AIP
, vol.67
, pp. 3057
-
-
Faist, J.1
Capasso, F.2
Sitori, C.3
Divco, D.L.4
Hutchinson, A.L.5
Cho, A.Y.6
-
2
-
-
21544480133
-
-
J. Faist, F. Capasso, C. Sitori, D. L. Sivco, A. L. Hutchinson, S. N. G. C. Chu, and A. Y. Cho, Appl. Phys. Lett. AIP 63, 1354 (1993).
-
(1993)
Appl. Phys. Lett. AIP
, vol.63
, pp. 1354
-
-
Faist, J.1
Capasso, F.2
Sitori, C.3
Sivco, D.L.4
Hutchinson, A.L.5
Chu, S.N.G.C.6
Cho, A.Y.7
-
5
-
-
3342926162
-
-
D. Y. Oberli, D. R. Wake, M. V. Klein, J. Klem, T. Henderson, and H. Morkoç, Phys. Rev. Lett. AIP 59, 696 (1987).
-
(1987)
Phys. Rev. Lett. AIP
, vol.59
, pp. 696
-
-
Oberli, D.Y.1
Wake, D.R.2
Klein, M.V.3
Klem, J.4
Henderson, T.5
Morkoç, H.6
-
6
-
-
0000112096
-
-
J. A. Levenson, G. Dolique, J. L. Oudar, and I. Abram, Phys. Rev. B AIP 41, 3688 (1990).
-
(1990)
Phys. Rev. B AIP
, vol.41
, pp. 3688
-
-
Levenson, J.A.1
Dolique, G.2
Oudar, J.L.3
Abram, I.4
-
7
-
-
0028486156
-
-
B. N. Murdin, G. M. H. Knippels, A. F. G. van der Meer, C. R. Pidgeon, C. J. G. M. Langerak, M. Helm, W. Heiss, K. Unterrainer, E. Gornik, K. K. Geerinck, N. J. Hovenier, and W. T. Wenckebach, Semicond. Sci. Technol. INS 9, 1554 (1994).
-
(1994)
Semicond. Sci. Technol. INS
, vol.9
, pp. 1554
-
-
Murdin, B.N.1
Knippels, G.M.H.2
Van Der Meer, A.F.G.3
Pidgeon, C.R.4
Langerak, C.J.G.M.5
Helm, M.6
Heiss, W.7
Unterrainer, K.8
Gornik, E.9
Geerinck, K.K.10
Hovenier, N.J.11
Wenckebach, W.T.12
-
8
-
-
21544481678
-
-
W. Heiss, E. Gornil, H. Hertle, B. Murdin, G. M. H. Knippels, C. J. G. M. Langerak, F. Schaffler, and C. R. Pidgeon, Appl. Phys. Lett. AIP 66, 3313 (1995).
-
(1995)
Appl. Phys. Lett. AIP
, vol.66
, pp. 3313
-
-
Heiss, W.1
Gornil, E.2
Hertle, H.3
Murdin, B.4
Knippels, G.M.H.5
Langerak, C.J.G.M.6
Schaffler, F.7
Pidgeon, C.R.8
-
9
-
-
0028371728
-
-
J. Faist, C. Sitori, F. Capasso, L. Pfeiffer, and K. West, Appl. Phys. Lett. AIP 64, 872 (1994).
-
(1994)
Appl. Phys. Lett. AIP
, vol.64
, pp. 872
-
-
Faist, J.1
Sitori, C.2
Capasso, F.3
Pfeiffer, L.4
West, K.5
-
10
-
-
0029634129
-
-
J. N. Heyman, K. Unterrainer, K. Craig, B. Galdrikian, K. Campman, P. F. Hopkins, A. C. Gossard, and M. S. Sherwin, Phys. Rev. Lett. AIP 74, 2682 (1995).
-
(1995)
Phys. Rev. Lett. AIP
, vol.74
, pp. 2682
-
-
Heyman, J.N.1
Unterrainer, K.2
Craig, K.3
Galdrikian, B.4
Campman, K.5
Hopkins, P.F.6
Gossard, A.C.7
Sherwin, M.S.8
-
11
-
-
21544441702
-
-
K. Craig, B. Galdrikian, J. N. Heyman, A. G. Markelz, M. S. Sherwin, K. Campman, P. F. Hopkins, and A. C. Gossard, Phys. Rev. Lett. (in press).
-
K. Craig, B. Galdrikian, J. N. Heyman, A. G. Markelz, M. S. Sherwin, K. Campman, P. F. Hopkins, and A. C. Gossard, Phys. Rev. Lett. (in press).
-
-
-
-
12
-
-
0028426075
-
-
W. J. Li, B. D. McCombe, J. P. Kaminski, S. J. Allen, M. J. Stockman, L. S. Muratov, L. N. Pandey, T. F. George, and W. J. Schaff, Semicond. Sci. Technol. INS 9, 630 (1994).
-
(1994)
Semicond. Sci. Technol. INS
, vol.9
, pp. 630
-
-
Li, W.J.1
McCombe, B.D.2
Kaminski, J.P.3
Allen, S.J.4
Stockman, M.J.5
Muratov, L.S.6
Pandey, L.N.7
George, T.F.8
Schaff, W.J.9
-
13
-
-
0028763855
-
-
J. N. Heyman, K. Craig, B. Galdrikian, K. Campman, P. F. Hopkins, S. Fafard, A. C. Gossard, and M. S. Sherwin, Phys. Rev. Lett. AIP 72, 2183 (1994).
-
(1994)
Phys. Rev. Lett. AIP
, vol.72
, pp. 2183
-
-
Heyman, J.N.1
Craig, K.2
Galdrikian, B.3
Campman, K.4
Hopkins, P.F.5
Fafard, S.6
Gossard, A.C.7
Sherwin, M.S.8
-
15
-
-
21544464515
-
-
Charge transfer to the upper state also leads to band bending and shifts in the transition energies and dipole matrix elements. Simulations indicate a change in the photovoltage signal of order ∼30% at saturation due to these effects, comparable to experimental uncertainty from other sources.
-
Charge transfer to the upper state also leads to band bending and shifts in the transition energies and dipole matrix elements. Simulations indicate a change in the photovoltage signal of order ∼30% at saturation due to these effects, comparable to experimental uncertainty from other sources.
-
-
-
|