Biaxial tests on cruciform specimens for the validation of crystallographic yield loci

Journal of Materials Processing Technology

Volumn 80-81, Issue , 1998, Pages 545-550

  Hoferlin, E ^a   Van Bael, A ^a   Van Houtte, P ^a   Steyaert, G ^b   De Mare, C ^b  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b Onderzoekscentrum voor de Aanwending van Staal   (Belgium)

Author keywords

Biaxial tensile test; Crystallographic texture; Finite elements; Taylor Bishop Hill models

Indexed keywords

EID: 0001090078     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-0136(98)00123-X     Document Type: Article

References (12)

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