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Volumn 76, Issue 12, 1994, Pages 8105-8112

Ultrahigh-vacuum scanning electron microscopy characterization of the growth of Fe on CaF2/Si(111): Selective nucleation on electron-beam modified surfaces

(3) Heim, K R a Hembree, G G a Scheinfein, M R a

a ARIZONA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001089817 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.357859 Document Type: Article

Times cited : (20)

References (44)

1
- 0344237471
- (1991) IEICE Trans. E , vol.74 , pp. 3326
- Sakaguchi, T.¹ Watanabe, M.² Asada, M.³

2
- 0000085154
- (1993) Appl. Phys. Lett , vol.62 , pp. 300
- Watanabe, M.¹ Suemasu, T.² Muratake, S.³ Asada, M.⁴

3
- 0026869350
- (1992) Electron. Lett , vol.28 , pp. 1002
- Muratake, S.¹ Watanabe, M.² Suemasu, T.³ Asada, M.⁴

4
- 0026897848
- (1992) Electron. Lett , vol.28 , pp. 1432
- Suemasu, T.¹ Watanabe, M.² Asada, M.³ Suzuki, N.⁴

5
- 0021515926
- (1984) Appl. Phys. Lett , vol.45 , pp. 907
- Smith, T.P.¹ Phillips, J.M.² Augustyniak, W.M.³ Stiles, P.J.⁴

6
- 33744595027
- (1989) CRC Crit. Rev. Solid State Mater. Sci , vol.15 , pp. 367
- Schowalter, L.J.¹ Fathauer, R.W.²

7
- 0001119767
- (1988) J. Appl. Phys , vol.63 , pp. 3140
- Schloemann, E.¹ Tustison, R.² Weissman, J.³ Van Hook, H.J.⁴ Varitimos, T.⁵

8
- 84943994960
- (1958) Z. Krist , vol.110 , pp. 372
- Bauer, E.¹

9
- 0004065549
- (North-Holland Elsevier Science, New York)
- (1988) Cohesion in Metals Transition Metal Alloys
- de Boer, F.R.¹ Boom, R.² Mattens, W.C.M.³ Miedema, A.R.⁴ Niessen, A.K.⁵

10
- 0343713806
- (1960) J. Appl. Phys , vol.31 , pp. 2208
- Gilman, J.J.¹

11
- 3743078161
- (1963) Can. J. Phys , vol.41 , pp. 1287
- Benson, G.C.¹ Claxton, T.A.²

12
- 74549223680
- (1980) J. Phys. (Paris) , vol.41 , pp. C6-488
- Tasker, P.W.¹

13
- 0004871574
- (1982) Appl. Phys. Lett , vol.41 , pp. 1102
- Harrison, T.R.¹ Mankiewich, P.M.² Dayem, A.H.³

14
- 0021374134
- (1984) Appl. Phys. Lett , vol.44 , pp. 468
- Mankiewich, P.M.¹ Craighead, H.G.² Harrison, T.R.³ Dayem, A.H.⁴

15
- 0022579495
- (1986) J. Vac. Sci. Technol. B , vol.4 , pp. 326
- Scheinfein, M.¹ Isaacson, M.²

16
- 0013466993
- (1988) J. Appl. Phys , vol.63 , pp. 1060
- Kanemaru, S.¹ Ishiwara, H.² Furukawa, S.³

17
- 36449000685
- (1994) J. Appl. Phys , vol.75 , pp. 2307
- Izumi, A.¹ Tsutsui, K.² Furukawa, S.³

18
- 0000793104
- (1992) Appl. Phys. Lett , vol.60 , pp. 2071
- Lucas, C.A.¹ Loretto, D.²

19
- 4244116311
- (1993) Phys. Rev. Lett , vol.70 , pp. 1826
- Lucas, C.A.¹ Wong, G.C.L.² Loretto, D.³

20
- 0000080606
- (1993) Phys. Rev. B , vol.48 , pp. 5716
- Wong, G.C.L.¹ Loretto, D.² Rotenberg, E.³ Olmstead, M.A.⁴ Lucas, C.A.⁵

21
- 84951337819
- One [formula omitted] triple layer (TL) represents the F-Ca-F repeat unit in the [111] direction. Each triple layer contains [formula omitted] and [formula omitted]

22
- 84951337818
- The [formula omitted] samples were kindly provided by D. Loretto of Lawrence Berkeley Laboratory

23
- 2842572019
- (1993) J. Appl. Phys , vol.74 , pp. 7422
- Heim, K.R.¹ Healy, S.D.² Yang, Z.J.³ Drucker, J.S.⁴ Hembree, G.G.⁵ Scheinfein, M.R.⁶

24
- 0023855712
- (1988) Ultramicroscopy , vol.25 , pp. 183
- Kruit, P.¹ Venables, J.A.²

25
- 84913007305
- (1991) Adv. Opt. Electron Microsc , vol.12 , pp. 93
- Kruit, P.¹

26
- 0000848203
- (1991) Appl. Phys. Lett , vol.58 , pp. 1890
- Hembree, G.¹ Drucker, J.² Luo, C.³ Krishnamurthy, M.⁴ Venables, J.⁵

27
- 0027109814
- (1992) Ultramicroscopy , vol.47 , pp. 109
- Hembree, G.G.¹ Venables, J.A.²

28
- 0026819581
- (1992) Surf. Sci. Lett , vol.262 , pp. L111
- Liu, J.¹ Hembree, G.G.² Spinnler, G.E.³ Venables, J.A.⁴

29
- 11544285615
- (1992) Catalysis Lett , vol.15 , pp. 133
- Liu, J.¹ Hembree, G.G.² Spinnler, G.E.³ Venables, J.A.⁴

30
- 84951337817
- Private communication with D. Loretto: Bright field transmission electron microscopy performed on the [formula omitted] samples revealed a nonuniform distribution of line defects at the [formula omitted] interface for some of the samples. This is an indication that stress relief occurred during the [formula omitted] growth. In comparison, an unrelaxed film will display a parallel array of line defects corresponding to the original steps on the Si(111) surface

31
- 0027729019
- (1993) Ultramicroscopy , vol.52 , pp. 369
- Liu, J.¹ Hembree, G.G.² Spinnler, G.E.³ Venables, J.A.⁴

32
- 0020849523
- (1983) J. Appl. Phys , vol.54 , pp. R1
- Seiler, H.¹

33
- 84951337808
- More specific details about the growth mechanisms for this system will be published in a subsequent paper by K. R. Heim, G. G. Hembree, M. R. Scheinfein, and J. A. Venables

34
- 0003406742
- 4th ed. (Wiley, New York)
- (1971) Introduction to Solid State Physics , pp. 259
- Kittel, C.¹

35
- 4243841560
- (1992) Phys. Rev. Lett , vol.68 , pp. 3749
- Xiao, J.Q.¹ Jiang, J.S.² Chien, C.L.³

36
- 36449008241
- (1991) J. Appl. Phys , vol.69 , pp. 5267
- Chien, C.L.¹

37
- 3643080041
- (1992) Phys. Rev. Lett , vol.68 , pp. 3745
- Berkowitz, A.E.¹ Mitchell, J.R.² Carey, M.J.³ Young, A.P.⁴ Zhang, S.⁵ Spada, F.E.⁶ Parker, F.T.⁷ Hutten, A.⁸ Thomas, G.⁹

38
- 0000052892
- (1993) J. Appl. Phys , vol.73 , pp. 5320
- Berkowitz, A.E.¹ Mitchell, J.R.² Carey, M.J.³ Young, A.P.⁴ Rao, D.⁵ Starr, A.⁶ Zhang, S.⁷ Spada, F.E.⁸ Parker, F.T.⁹ Hutten, A.¹⁰ Thomas, G.¹¹

39
- 0040683045
- (1993) Appl. Phys. Lett , vol.63 , pp. 1579
- Coffey, K.R.¹ Hylton, T.L.² Parker, M.A.³ Howard, J.K.⁴

40
- 84951337802
- Calculations were made to determine the change in the Gibbs energy during formation reactions of Fe with [formula omitted] and Fe with NaCl (both at 700 and 1000 K). The results indicate that a chemical reaction beginning with gaseous reactants is more likely than those beginning with solid reactants, although both cases favored an Fe-NaCl reaction over an [formula omitted] reaction. This, coupled with the fact that NaCl has a much higher vapor pressure than [formula omitted] ([formula omitted] vs [formula omitted] at 700 K and [formula omitted] vs [formula omitted] at 1000 K, with pressure in mbars), suggests that a gaseous reaction involving NaCl is more probable than that with [formula omitted]

41
- 0014535245
- (1969) J. Vac. Sci. Technol , vol.6 , pp. 537
- Wassermann, E.F.¹ Sander, W.²

42
- 0001080881
- (1966) J. Vac. Sci. Technol , vol.3 , pp. 133
- Matthews, J.W.¹

43
- 0041724683
- (1964) J. Appl. Phys , vol.35 , pp. 482
- Goetze, G.W.¹ Boerio, A.H.² Green, M.³

44
- 77956711142
- (1968) Adv. Electron. Electron Phys , vol.22 , pp. 219
- Goetze, G.W.¹

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