Flash temperature induced magnetic degradation in high density magnetic recording

Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 6158-6160

  Yuan, Zhi Min ^a   Liu, Bo ^a   Wang, Jiwen ^a   Ding, Jun ^b  

^a DATA STORAGE INSTITUTE   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001085971     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372641     Document Type: Article

References (5)

1. M. Suk and D. Jen, IEEE Trans. Magn. 34, 1711 (1998).
2. T. G. Jeong and D. B. Bogy, IEEE Trans. Magn. 31, 1007 (1995).
3. M. Suk, P. Dennig, and D. Gillis, STLE/ASME Tribology Conference, 11-13 October, 1999.
4. R. C. O'Handley and O. Song, Trans. Mater. Res. Soc. Jpn. 15, 887 (1994).
5. H. N. Bertram and Q. Peng, IEEE Trans. Magn. 34, 1543 (1998).