High-accuracy, infrared, spectral responsivity scale

Metrologia

Volumn 35, Issue 4, 1998, Pages 543-548

  Theocharous, E ^a   Prior, T R ^a   Haycocks, P R ^a   Fox, N P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001078064     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/35/4/57     Document Type: Article

References (11)

1. Nettleton D. H., Prior T. R., Ward T. H., Metrologia, 1993, 30, 425-432.
2. Martin J. E., Fox N. P., Key P. J., Metrologia, 1985, 21, 147-155.
3. 2 laser manual, 1991.
4. Fowler J. B., Lind M. A., Zalewski E. F., Natl. Bur. Stand. (US) Tech. Note 987, US Government Printing Office, Washington, D.C., 1979.
5. Fox N. P., Haycocks P. R., Martin J. E., Ul-Haq I., Metrologia, 1995/96, 32, 581-584.
6. Li A. H., J. Phys. Chem. Ref. Data, 1984, 13, 103-150.
7. Theocharous E., Fox N. P., Prior T. R., Optical Radiation Measurements III, Proc. SPIE, 1996, 2815, 56-69.
8. Fox N. P., Prior T. R., Theocharous E., Proc. 2nd NATO/IRIS Joint Symposium, 25-28 June 1996, London.
9. Stetson K. A., Opt. Eng., 1975, 14, 482-486.
10. The Vocabulary of Metrology, Guide to the Expression of Uncertainty in Measurement. Part 3, British Standards Institute, PD 6461, 1995.
11. Rothman L. S. et al., Appl. Opt., 1987, 26, 4058-4097.