A simple microbeam profiling technique for x-ray optics

Review of Scientific Instruments

Volumn 71, Issue 7, 2000, Pages 2640-2643

  Lankosz, M ^a   Sieber, J ^b  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001076240     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150669     Document Type: Article

References (8)

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2. A. G. Attaelmanan, Ph.D. thesis, Chalmers University of Technology, 1995.
3. A. Attaelmanan, A. Rindby, and P. Voglis, Nucl. Instrum. Methods Phys. Res. B 82, 481 (1993).
4. A. G. Attaelmanan, P. Voglis, A. Rindby, S. Larson, and P. Engstrom, Rev. Sci. Instrum. 66, 24 (1995).
5. P. A. Pella and L. Feng, Adv. X-Ray Anal. 35B, 1063 (1992).
6. D. C. Wherry, B. J. Cross, and T. H. Briggs, Adv. X-Ray Anal. 31, 93 (1987).
7. R. P. Bevington, Data Reduction and Error Analysis for the Physical Sciences (McGraw-Hill, New York, 1969).
8. T. Jach (private communication).