Unified analysis of the sensitivities of reflectance and path length to scattering variations in a diffusive medium

Applied Optics

Volumn 40, Issue 10, 2001, Pages 1742-1746

  Liu, Hanli ^a  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; REFLECTION; REFRACTIVE INDEX;

OPTICAL PATH LENGTHS;

SCATTERING;

EID: 0001074923     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.001742     Document Type: Article

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