Microstructure imaging of C54-TiSi2 polycrystalline thin films by micro-Raman spectroscopy

Applied Physics Letters

Volumn 75, Issue 20, 1999, Pages 3090-3092

  Meinardi, F ^a   Quilici, S ^a   Borghesi, A ^a   Artioli, G ^b  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b UNIVERSITY OF MILAN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001073896     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125240     Document Type: Article

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