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Journal of Crystal Growth

Volumn 42, Issue C, 1977, Pages 431-434

The Czochralski growth of optical quality bismuth silicon oxide (Bi12SiO20)

(3) Tanguay Jr , A R a Mroczkowski, S a Barker, R C a

a YALE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001073590 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/0022-0248(77)90227-5 Document Type: Article

Times cited : (75)

References (9)

1
- 0016377650
- Pockels-Effect Imaging Devices and Their Applications
- B. Kazan, Academic Press, New York
- (1974) Advances in Image Pickup and Display , vol.1
- Marie¹ Donjon² Hazan³

2
- 0016101321
- (1974) Appl. Opt. , vol.13 , pp. 2052
- Lipson¹ Nisenson²

3
- 0001737365
- (1976) Appl. Phys. Letters , vol.29 , pp. 591
- Huignard¹ Micheron²

4
- 0037833015
- (1973) J. Crystal Growth , vol.20 , pp. 251
- Ballman¹ Brown² Tien³ Martin⁴

5
- 84916044455
- United Mineral and Chemical Corp., 129 Hudson St., New York, New York 10013, U.S.A.

6
- 49549150443
- The Czochralski growth of Bi12SiO20 crystals
- (1974) Journal of Crystal Growth , vol.24-25 , pp. 429
- Brice¹ Bruton² Hill³ Whiffin⁴

7
- 0001199035
- (1976) J. Crystal Growth , vol.32 , pp. 205
- Whiffin¹ Bruton² Brice³

8
- 84916044454
- Courtesy of Johnson Matthey Chemicals, Ltd., London, England.

9
- 84916044453
- A.R. Tanguay, Jr., S. Mroczkowski and R.C. Barker, to be published.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.