FT-Raman Spectroscopy of Thin Films of Titanyl Phthalocyanine and Vanadyl Phthalocyanine

Journal of Raman Spectroscopy

Volumn 27, Issue 12, 1996, Pages 867-872

  Jennings, C A ^a   Aroca, R ^a,b   Kovacs, G J ^a   Hsaio, C ^a  

^a XEROX RESEARCH CENTRE OF CANADA   (Canada)

^b UNIVERSITY OF WINDSOR   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM ALLOYS; GLASS SUBSTRATES; INDIUM ALLOYS; MICHELSON INTERFEROMETERS; NEODYMIUM LASERS; RAMAN SCATTERING; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR ALLOYS; TERNARY ALLOYS; THIN FILMS; X RAY DIFFRACTION; YTTRIUM ALUMINUM GARNET;

FT- RAMAN SPECTROSCOPY; FT-RAMAN SPECTRUM; GLASS SUBSTRATES; LASER EMITTING; ND:YAG LASER; THIN SOLID FILM; THIN-FILMS; TITANYL PHTHALOCYANINES; TYPE II; VANADYL PHTHALOCYANINE;

ROOM TEMPERATURE;

EID: 0001068379     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4555(199612)27:12<867::AID-JRS43>3.0.CO;2-H     Document Type: Article

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