Electron paramagnetic resonance studies on microcrystalline silicon prepared by sputtering method

Journal of Applied Physics

Volumn 88, Issue 3, 2000, Pages 1698-1700

  Ehara, Takashi ^a   Ikoma, Tadaaki ^b   Akiyama, Kimio ^b   Tero Kubota, Shozo ^b  

^a ISHINOMAKI SENSHU UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001066776     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373875     Document Type: Article

References (18)

1. Z. Iqbal and S. Veprek, J. Phys. C 15, 377 (1982).
2. Y. Nishima, S. Miyazaki, M. Hirose, and Y. Osaka, Philos. Mag. B 46, 1 (1982).
3. T. Okada, T. Iwaki, K. Yamamoto, H. Kasahara, and K. Abe, Solid State Commun. 49, 809 (1984).
4. Y. Uchida, T. Ichimura, M. Ueno, and H. Haruki, Jpn. J. Appl. Phys., Part 2 21, L586 (1982).
5. H. Okada, Y. Uchida, and M. Matsumura, Jpn. J. Appl. Phys., Part 2 25, L718 (1986).
6. A. Matsuda, J. Non-Cryst. Solids 59/60, 767 (1983).
7. P. C. Taylor, Semiconductors and Semimetals (Academic, New York, 1984), Vol. 21, Part C, p. 129.
8. W. L. Warren, F. C. Rong, E. H. Poindexter, J. Kanicki, and G. J. Gerardi, Appl. Phys. Lett. 58, 2417 (1991).
9. F. Finger, C. Malten, P. Hapke, R. Carius, R. Flueckiger, and H. Wagner, Philos. Mag. Lett. 70, 247 (1994).
10. T. Ehara and T. Nagasawa, Mater. Lett, (in press).
11. M. H. Brodsky, M. Cardona, and J. J. Cuomo, Phys. Rev. B 16, 3556 (1977).
12. Y. Mishima, T. Hamasaki, H. Kurta, M. Hirose, and Y. Osaka, Jpn. J. Appl. Phys. 20, L121 (1981).
13. T. Ehara, T. Ikoma, and S. Tero-Kubota, J. Non-Cryst. Solids (in press).
14. Y. Nishi, Jpn. J. Appl. Phys. 10, 52 (1971).
15. V. Y. Bratus, S. S. Ishchenko, S. M. Okulov, and I. P. Vorona, Phys. Rev. B 50, 15449 (1994).
16. F. C. Rong, J. F. Harvey, E. H. Poindexter, and G. J. Gerardi, Appl. Phys. Lett. 63, 920 (1993).
17. D. L. Griscom, J. Ceram. Soc. Jpn. 99, 923 (1991).
18. M. E. Zvanut, W. E. Carlos, J. A. Freitas, Jr., K. D. Jamison, and R. P. Hellmer, Appl. Phys. Lett. 65, 2287 (1994).