Characterization of thin AlGaAs/InGaAs/GaAs quantum-well structures bonded directly to SiO2/Si and glass substrates

Journal of Applied Physics

Volumn 66, Issue 1, 1989, Pages 459-462

  Klem, J F ^a   Jones, E D ^a   Myers, D R ^a   Lott, J A ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

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Indexed keywords

EID: 0001066332     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.343850     Document Type: Article

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