Enhanced Raman scattering from self-affine thin films

Optics Letters

Volumn 21, Issue 20, 1996, Pages 1628-1630

  Poliakov, Evgeni Y ^a   Shalaev, Vladimir M ^a   Markel, Vadim A ^a,c   Botet, Robert ^b  

^a NEW MEXICO STATE UNIVERSITY   (United States)

^b UNIVERSITÉ PARIS SUD   (France)

^c INSTITUTE OF AUTOMATION AND ELECTROMETRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001065548     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.001628     Document Type: Article

References (14)

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