Use of the trace map for evaluating localization properties

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 17, 1999, Pages 11315-11321

  Naumis, G ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001056623     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.11315     Document Type: Article

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