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Volumn 53, Issue 3, 1996, Pages 1573-1578
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Ion-beam-induced modification of fullerene films as studied by electron-energy-loss spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001050787
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.53.1573 Document Type: Article |
Times cited : (14)
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References (14)
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