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Volumn 53, Issue 3, 1996, Pages 1573-1578

Ion-beam-induced modification of fullerene films as studied by electron-energy-loss spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001050787     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.1573     Document Type: Article
Times cited : (14)

References (14)
  • 14
    • 85037887242 scopus 로고    scopus 로고
    • T. Shanan (private communication)
    • Shanan, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.