Filtered x-ray diode diagnostics fielded on the Z accelerator for source power measurements

Review of Scientific Instruments

Volumn 70, Issue 1 II, 1999, Pages 561-565

  Chandler, G A ^a   Deeney, C ^a   Cuneo, M ^a   Fehl, D L ^a   McGurn, J S ^a   Spielman, R B ^a   Torres, J A ^a   McKenney, J L ^b   Mills, J ^b   Struve, K W ^c  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b KTECH CORPORATION   (United States)

^c MISSION RESEARCH CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001042868     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149355     Document Type: Article

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