Excess-noise dependence on intracavity aperture shape

Applied Optics

Volumn 38, Issue 33, 1999, Pages 6874-6878

  Karman, G P ^a,b   Mc Donald, G S ^a,c,d   Woerdman, J P ^a   New, G H C ^c  

^a LEIDEN UNIVERSITY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

^c IMPERIAL COLLEGE LONDON   (United Kingdom)

^d UNIVERSITY OF SALFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001037433     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.006874     Document Type: Article

References (16)

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