Varied-line-spacing laminar-type holographic grating for the standard soft X-ray flat-field spectrograph

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4146, Issue 1, 2000, Pages 163-170

  Koike, Masato ^a   Namioka, Takeshi ^a   Gullikson, Eric ^a   Harada, Yoshihisa ^a   Ishikawa, Sadayuki ^a   Imazono, Takashi ^a   Mrowka, Stanley ^a   Miyata, Noboru ^a   Yanagihara, Mihiro ^a   Underwood, James H ^a   Sano, Kazuo ^a   Ogiwara, Tokuo ^a   Yoda, Osamu ^a   Nagai, Shiro ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

diffraction efficiency; Diffraction grating; flat field spectrograph; holographic grating; soft X ray; Spectrometer

Indexed keywords

DIFFRACTION GRATINGS; ETCHING; SYNCHROTRON RADIATION; X RAY SPECTROGRAPHS;

ASPHERIC WAVE-FRONT RECORDING SYSTEM; SOFT X-RAY FLAT-FIELD SPECTROGRAPH; VARIED-LINE-SPACING LAMINAR-TYPE HOLOGRAPHIC GRATING;

HOLOGRAPHY;

EID: 0001032910     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.406669     Document Type: Article

References (0)