On the dynamic range in depth profiling with electron-gas SNMS

Fresenius' Journal of Analytical Chemistry

Volumn 358, Issue 1-2, 1997, Pages 300-303

  Bock, W ^a   Kopnarski, M ^a   Oechsner, H ^a  

^a University of Koblenz Landau   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001025249     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050412     Document Type: Article

References (11)

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