Investigation of the influence of edge structure on the micromagnetic behavior of small magnetic elements

Journal of Applied Physics

Volumn 87, Issue 6, 2000, Pages 2994-2999

  Herrmann, M ^a   McVitie, S ^a   Chapman, J N ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001023774     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372289     Document Type: Article

References (11)

1. K. J. Kirk, J. N. Chapman, and C. D. W. Wilkinson, Appl. Phys. Lett. 71, 539 (1997).
2. J. Gadbois and J.-G. Zhu, IEEE Trans. Magn. 31, 3802 (1995).
3. J. N. Chapman, J. Phys. D: Appl. Phys. 17, 623 (1984).
4. L. Reimer, Transmission Electron Microscopy, Springer Series Vol. 36, 4th ed. (Springer, Berlin, 1984).
5. M. Ruhrig, B. Khamsehpour, K. J. Kirk, J. N. Chapman, P. Aitchison, S. McVitie, and C. D. W. Wilkinson, IEEE Trans. Magn. 32, 4452 (1996).
6. B. Khamsehpour, C. D. W. Wilkinson, J. N. Chapman, and A. B. Johnston, J. Vac. Sci. Technol. B 14, 3361 (1996).
7. K. Tsuno and M. Inoue, Optik (Stuttgart) 67, 363 (1984).
8. S. J. Hefferman, J. N. Chapman, and S. McVitie, J. Magn. Magn. Mater. 95, 76 (1991).
9. J. N. Chapman, A. B. Johnston, L. J. Heyderman, S. McVitie, W. A. P. Nicholson, and B. Bormans, IEEE Trans. Magn. 30, 4479 (1994).
10. M. Scheinfein (private communication).
11. S. McVitie and J. N. Chapman, IEEE Trans. Magn. 24, 1778 (1988).