X-ray phase determination by the principle of minimum charge

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 55, Issue 3, 1999, Pages 489-499

  Elser, Veit ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001020691     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767398013324     Document Type: Article

References (13)

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9. Qiu, S.-Y. & Jaric, M. V. (1990). Quasicrystals, edited by M. V. Jaric & S. Lundqvist, p. 19. Singapore: World Scientific.
10. Rokhsar, D. S., Mermin, N. D. & Wright, D. C. (1987). Phys. Rev. B, 35, 5487-5495.
11. Sayre, D. (1952). Acta Cryst. 5, 60-65.
12. Steurer, W., Haibach, T. & Zhang B. (1993). Acta Cryst. B49, 661-675.
13. Viterbo, D. (1992). Fundamentals of Crystallography, ch. 5. IUCr/Oxford University Press.