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Volumn 16, Issue 12, 1983, Pages 1871-1880

Microstructure of Ionomers: Interpretation of Small-Angle X-ray Scattering Data

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001019909     PISSN: 00249297     EISSN: 15205835     Source Type: Journal    
DOI: 10.1021/ma00246a013     Document Type: Article
Times cited : (426)

References (49)
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    • Contemporary Topics in Polymer Science
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    • (1979) , vol.3 , pp. 231
    • Eisenberg, A.1
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    • U.S. Patent
    • 4014847 (Mar 29, to Exxon Research and Engineering Co.
    • R.D. Lundberg, H.S. Makowski, and L. Westerman, U.S. Patent 4014847 (Mar 29, 1977) to Exxon Research and Engineering Co.
    • (1977)
    • Lundberg, R.D.1    Makowski, H.S.2    Westerman, L.3
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    • 0004533261 scopus 로고
    • U.S. Patent
    • 3870841 (Mar 11, to Exxon Research and Engineering Co.
    • H.S. Makowski, R.D. Lundberg, and G.H. Singhal, U.S. Patent 3870841 (Mar 11, 1975) to Exxon Research and Engineering Co.
    • (1975)
    • Makowski, H.S.1    Lundberg, R.D.2    Singhal, G.H.3
  • 29
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    • Small Angle Scattering of X-rays
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    • (1955)
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    • Reference 29, p. 140.
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    • Reference 29, p. 10.
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    • Reference 29, p. 35.
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  • 36
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    • Reference 29, pp. 41, 44.
  • 41
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    • Direct Analysis of Diffraction by Matter
    • North-Holland, Publishing Co., Amsterdam
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    • Hosemann, R.1    Bagchi, S.N.2
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    • Ph. D. Thesis
    • Polymer Science and Engineering Department, University of Massachusetts
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    • Reference 29, p. 49.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.