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Volumn 56, Issue 3, 2000, Pages 282-283

(2,2′-Dipyridyl sulfide-N,N′)hydroxybis(nitrito-O)(nitrogen monoxide-N)-ruthenium(III)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001014802     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270199014687     Document Type: Article
Times cited : (9)

References (13)
  • 7
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M. (1990a). SHELXTL-Plus. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1990) SHELXTL-Plus
    • Sheldrick, G.M.1
  • 9
    • 0004150157 scopus 로고    scopus 로고
    • University of Göttingen, Germany
    • Sheldrick, G. M. (1997). SHELXL97. University of Göttingen, Germany.
    • (1997) SHELXL97
    • Sheldrick, G.M.1
  • 10
    • 0342740177 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1989). P3/V. Release 4.21. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1989) P3/V. Release 4.21
    • Siemens1
  • 11
    • 0011218391 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1996). XPW in SHELXTL. Version 5.0.5. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1996) XPW in SHELXTL. Version 5.0.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.