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Volumn 83, Issue 1, 1999, Pages 148-151
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Vacancy in Relaxed p-Type Si1-x Gex Alloys: Evidence for Strong Disorder Induced Relaxation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001014622
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.83.148 Document Type: Article |
Times cited : (16)
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References (19)
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