Simulation of dc resistivity data: Questioning critical scaling for the high copper oxides

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 5, 2000, Pages 3267-3269

  Brown, Brandon ^a  

^a UNIVERSITY OF SAN FRANCISCO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001011979     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.3267     Document Type: Article

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