Effects of boundary roughness on the conductance of quantum wires

Applied Physics Letters

Volumn 77, Issue 15, 2000, Pages 2364-2366

  Csontos, D ^a   Xu, H Q ^a  

^a LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001010657     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1311606     Document Type: Article

References (19)

1. B. J. van Wees, H. van Houten, C. W. J. Beenaker, J. G. Williamson, L. P. Kouwenhoven, D. van der Marel, and C. T. Foxon, Phys. Rev. Lett. 60, 848 (1988).
2. D. A. Wharam, T. J. Thornton, R. Newbury, M. Pepper, H. Ahmed, J. E. F. Frost, D. G. Hasko, D. C. Peacock, D. A. Ritchie, and G. A. C. Jones, J. Phys. C 21, L209 (1988).
3. C.-T. Liang, M. Y. Simmons, C. G. Smith, D. A. Ritchie, and M. Pepper, Appl. Phys. Lett. 75, 2975 (1999).
4. Y. Hirayama, T. Saku, and Y. Horikoshi, Phys. Rev. B 39, 5535 (1989).
5. A. Yacoby, H. L. Stormer, N. S. Wingreen, L. N. Pfeiffer, K. W. Baldwin, and K. W. West, Phys. Rev. Lett. 77, 4612 (1996).
6. J.-O. J. Wesström, K. Hieke, B. Stålnacke, and T. Palm, Appl. Phys. Lett. 70, 1302 (1997).
7. P. Ramvall, N. Carlsson, I. Maximov, P. Omling, L. Samuelson, W. Seifert, Q. Wang, and S. Lourdudoss, Appl. Phys. Lett. 71, 918 (1997).
8. I. Maximov, N. Carlsson, P. Omling, P. Ramvall, L. Samuelson, W. Seifert, Q. Wang, S. Lourdudoss, R. Messmer, A. Forchel, and K. Kerkel, Semicond. Sci. Technol. 13, A67 (1998).
9. A. Kristensen, J. B. Jensen, M. Zaffalon, C. B. Sørensen, S. M. Reimann, and P. E. Lindelof, J. Appl. Phys. 83, 607 (1998).
10. B. E. Kane, G. R. Facer, A. S. Dzurak, N. E. Lumpkin, R. G. Clark, L. N. Pfeiffer, and K. W. West, Appl. Phys. Lett. 72, 3506 (1998).
11. L. Worschech, F. Beuscher, and A. Forchel, Appl. Phys. Lett. 75, 578 (1999).
12. T. Ando and H. Tamura, Phys. Rev. B 46, 2332 (1992).
13. Y. Takagaki and D. K. Ferry, J. Phys.: Condens. Matter 4, 10421 (1992).
14. K. Nikolié and A. MacKinnon, Phys. Rev. B 50, 11008 (1994).
15. G. Kirczenow, Solid State Commun. 68, 715 (1988).
16. H. Q. Xu, Phys. Rev. B 47, 15630 (1993).
17. Q. Wang, N. Carlsson, I. Maximov, P. Omling, L. Samuelson, W. Seifert, W. Sheng, I. Shorubalko, and H. Q. Xu, Appl. Phys. Lett. 76, 2274 (2000).
18. H. Q. Xu, Phys. Rev. B 50, 8469 (1994).
19. We should note that for a given profile of rough boundaries, no significant difference was found in comparison between the calculations of the conductance shown in this work, where the QWRs were divided into a large number of sections of width dx = 2 nm, and the calculations in which the QWRs were divided into an even larger number of sections with even smaller width dx.