AlGaInP-based microcavity light-emitting diodes: Controlled on-wafer detuning and measurement of the internal quantum efficiency

Applied Physics Letters

Volumn 75, Issue 26, 1999, Pages 4052-4054

  Royo, P ^a   Stanley, R P ^a   Houdre R ^a   Ilegems, M ^a   Moser, M ^b   Hovel R ^b   Schweizer, H P ^b   Gulden, K H ^b  

^a EPFL   (Switzerland)

^b CSEM   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000991397     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125533     Document Type: Article

References (12)

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