Model-based resolution: Applying the theory in quantitative microscopy

Applied Optics

Volumn 39, Issue 17, 2000, Pages 2948-2958

  Santos, Andrés ^a   Young, Ian T ^b  

^a UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIFFRACTIVE OPTICS; OPTICAL MICROSCOPY;

POISSON NOISE;

IMAGE PROCESSING;

EID: 0000983614     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.002948     Document Type: Article

References (12)

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