Critical Paths in Circuits with Level-Sensitive Latches

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 3, Issue 2, 1995, Pages 273-291

  Burks, Timothy M ^a   Sakallah, Karem A ^a   Mudge, Trevor N ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000981228     PISSN: 10638210     EISSN: 15579999     Source Type: Journal    
DOI: 10.1109/92.386227     Document Type: Article

References (19)

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