Anisotropic scatter patterns and anomalous birefringence of obliquely deposited cerium oxide films

Applied Optics

Volumn 35, Issue 28, 1996, Pages 5563-5568

  Hodgkinson, Ian ^a   Cloughley, Sarah ^a   Wu, Qi Hong ^a   Kassam, Samer ^a  

^a UNIVERSITY OF OTAGO   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000979591     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.005563     Document Type: Article

References (9)

1. T. Motohiro and Y. Taga, “Thin film retardation plate by oblique deposition,” Appl. Opt. 28, 2466-2482 (1989).
2. Q. H. Wu and I. J. Hodgkinson, “Materials for birefringent coatings,” Opt. Photon. News 5(5), S9-S10 (1994).
3. 2 birefringent films,” Appl. Opt. 33, 2659-2663 (1994).
4. I. J. Hodgkinson, P. I. Bowmar, and Q. H. Wu, “Scatter from tilted-columnar birefringent thin films: observation and measurement of anisotropic scatter distributions,” Appl. Opt. 34, 163-168 (1995).
5. I. J. Hodgkinson and Q. H. Wu, “Optical properties of single layer and multilayer anisotropic coatings,” in Optical Interference Coatings, F. Abeles, ed., Proc. SPIE 2253, 882-892 (1994).
6. Q. H. Wu and I. J. Hodgkinson, “Transmission-mode perpendicular incidence ellipsometry of anisotropic thin films,” J. Opt. 25, 43-49 (1994).
7. T. Muller and H. K. Pulker, “Thin film morphology in TEM as revealed by heat-shock fracturing and replication of film cross sections,” in Optical Interference Coatings, F. Abeles, ed., Proc. SPIE 2253, 584-595 (1994).
8. J. M. Nieuwenhuizen and H. B. Haanstra, “Microfractography of thin films,” Philips Tech. Rev. 27, 87-91 (1966).
9. S. Kassam, I. J. Hodgkinson, Q. H. Wu, and S. C. Cloughley, “Light scattering from thin films with an oblique columnar structure and with granular inclusions,” J. Opt. Soc. Am. A 12, 2009-2021.