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Volumn 53, Issue 14, 1996, Pages R8824-R8827

Soft-x-ray fluorescence study of buried silicides in antiferromagnetically coupled Fe/Si multilayers

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EID: 0000950956     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.R8824     Document Type: Article
Times cited : (36)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.