Self-consistent analysis of resonant tunneling current

Applied Physics Letters

Volumn 49, Issue 19, 1986, Pages 1248-1250

  Ohnishi, Hiroaki ^a   Inata, Tsuguo ^a   Muto, Shunichi ^a   Yokoyama, Naoki ^a   Shibatomi, Akihiko ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000948729     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.97428     Document Type: Article

References (9)