Synchrotron x-ray diffraction study of the disordering of the Ge(111) surface at high temperatures

Physical Review Letters

Volumn 66, Issue 15, 1991, Pages 2002-2005

  Mak, A ^a,b,c,d   Evans Lutterodt, K W ^a,b,c,d   Blum, K ^a,b,c,d   Noh, D Y ^a,b,c,d   Brock, J D ^a,b,c,d   Held, G A ^a,b,c,d   Birgeneau, R J ^a,b,c,d  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c Department of Obstetrics Gynecology   (United States)

^d IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000937466     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.66.2002     Document Type: Article

References (12)