Micromagnetics of soft magnetic thin films in presence of defects

Journal of Applied Physics

Volumn 78, Issue 12, 1995, Pages 7220-7225

  Komine, Takashi ^a   Mitsui, Yu ^a   Shiiki, Kazuo ^a  

^a KEIO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000937312     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360432     Document Type: Article

References (0)