On the performance of an optical filter for the XMM focal plane CCD-camera EPIC.

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2808, Issue , 1996, Pages 421-437

  Stephan, K H ^a   Reppin, C ^a   Hirschinger, M ^a   Maier, H J ^b   Frischke, D ^b   Fuchs, D ^c   Muller P ^c   Gurtler P ^d  

^a MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^b UNIVERSITY OF MUNICH   (Germany)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^d DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTIVE APERTURE; ELECTRICAL QUALIFICATION; HIGH TRANSPARENCY; MANUFACTURING PROCESS; ORDERS OF MAGNITUDE; SPECTRAL TRANSMITTANCE; SUPPORT STRUCTURES; X-RAY OBSERVATIONS;

ALUMINUM COATINGS; ASTRONOMY; ENVIRONMENTAL TESTING; FOCUSING; GAMMA RAYS; INFRARED DEVICES; OPTICAL FILTERS; POLYPROPYLENES;

X RAYS;

EID: 0000935186     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.256018     Document Type: Conference Paper

References (16)

1. K.O Mason, G.F. Bignami, A.C. Brinkman, and A. Peacock, " The ESA highthroughput X-ray spectroscopy mission XMM, " Milano Preprint Series inAstrophysics 138 (1994).
2. K.H. Stephan, C. Reppin, H.J. Maier, D. Frischke, D. Fuchs, P. MUller, S. Mölller,P. Gürtler, " Transmittance performance of polypropylene, poly-para-xylylene andpolycarbonate films in the photon energy range from 1 eV to 1 0 keV, " SPIE Vol.2279 1994)134-142.
3. K.H. Stephan, C. Reppin, H.J. Maier et al., " On the performance of optical filtersfor the XMIN'I focal plane CCD-camera EPIC, "Nucl. Instrum. and Meth. A 362(1995)178-182.
4. L. StrUder et al.,"The MPI/AIT X-ray-imager-high-speed-pn CCDsfor X-ray detection, " Nuci. Instrum. and Meth. A 288(1) (1990)227.
5. MOXTEK Inc., 452 West 1260 North Orem, Utah 84057, USA.
6. D.M. Barrus, R.L. Blake, " Technique for producing ultrathin polypropylene films,U Rev, Sci. Instrum., Vol. 48, No. 2.
7. M.A. Spivack, " Mechanical properties of very thin polymer films, " Rev. Sci. Instrum. 43 (1972)7.
8. Varian Publication No. 85100868 00 and reference therein for thin film application, O.S. Heavens, " Optical properties of thin solid films, " Dover, (1965) 113-116.
9. G. Zimmerer, " Status report on luminescence investigations with synchrotron radiation at HASYLAB, " Nucl. Instrum. and Meth. A 308 (1991) 178 and references therein.
10. J. Holland, M.C.E. Huber, M. Kiihne," Hollow cathode transfer standards for the radiometric calibration of VUV telescopes of the solar and heliosheric observatory (SOTTO)," Metrologica 30 (1993) 381.
11. D. Fuchs, M. Krumrey, T. Lederer, P. Miiller, F. Scholze, G. Ulm, " Soft x-ray reflectometer for large and complex samples using synchrotron radiation, " Proc. SPIE 2279, 402-410(1994).
12. B. Aschenbach, H. Brauninger, K.-H. Stephan and J. Triimper, " X-ray test facilities at Max-Planck-Institut Garching, " Space Optics Imaging X-ray Optics Workshop, SPIE 184 (1979) 234.
13. B.L. Henke et al., At. Data Nucl. Tables 27 (1986) 1.
14. J. Lohrengel, " Determination of the surface temperature of poor heat conducting materials by radiation measurements from-60 °C to + 250 °C in vacuum, " Warme-und Stoffiibertragung21 (1987) 1.
15. IABG (Industrieanlagen-Betriebsgesellschaft mbH D-85521 Ottobrunn) report no. 054/1996 in preparation.
16. Hoechst AG, " Bestimmung der Wasserdampfdurchlassigkeit, " Deutsche Norm DIN 53122 Teil 2, (1982).