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Volumn 68, Issue 21, 1996, Pages 3815-3821

Fast-Scan Voltammetry of Cyclic Nitroxide Free Radicals

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000934571     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac960603m     Document Type: Article
Times cited : (44)

References (36)
  • 22
    • 85033809164 scopus 로고    scopus 로고
    • Master's Thesis, Illinois State University, Normal, IL
    • Whited, B. L. Master's Thesis, Illinois State University, Normal, IL, 1996.
    • (1996)
    • Whited, B.L.1
  • 30
    • 85033830399 scopus 로고    scopus 로고
    • note
    • -1, and T = 298 K. The value differs from the expected 58 mV due to contributions of convergent diffusion.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.