The effect of electron pressure on suspended helium films

Physica B: Condensed Matter

Volumn 284-288, Issue PART I, 2000, Pages 172-173

  Valkering, Annemarie ^a   Klier, Jürgen ^a   Leiderer, Paul ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

2D electrons; Electron pressure; Suspended helium films

Indexed keywords

CARRIER CONCENTRATION; ELECTRONS; INTERFEROMETRY;

ELECTRON PRESSURE;

SUPERFLUID HELIUM;

EID: 0000930062     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)02290-5     Document Type: Article

References (7)

1. A.P. Volodin, M.S. Khaikin, V.S. Edel'man, JETP Lett. 26 (1977) 543.
2. M. Wanner, P. Leiderer, Phys. Rev. Lett. 42 (1979) 315.
3. H. Etz, W. Gombert, W. Idstein, P. Leiderer, Phys. Rev. Lett. 53 (1984) 2567.
4. D. Marty, J. Phys. C: Solid State Phys. 19 (1986) 6097.
5. A.M.C. Valkering, P.K.H. Sommerfeld, P.J. Richardson, R.W. van der Heijden, A.T.A.M. de Waele, Czech. J. Phys. 46 (1996) 321.
6. A.M.C. Valkering, J. Klier, E. Teske, R.W. van der Heijden, P. Leiderer, J. Low Temp. Phys. 113 (1998) 1115.
7. A.M.C. Valkering, R.W. van der Heijden, Physica B 249-251 (1998) 652.