An elastically bent silicon monochromator for a neutron diffractometer

Journal of Applied Crystallography

Volumn 32, Issue 3, 1999, Pages 525-529

  Tanaka, Ichiro ^a   Niimura, Nobuo ^a   Mikula, Pavel ^b  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b NUCLEAR PHYSICS INSTITUTE   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000926284     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899003192     Document Type: Article

References (13)

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