Analysis and depth profiling of deuterium with the D(3He, p)4He reaction by detecting the protons at backward angles

Nuclear Instruments and Methods

Volumn 166, Issue 3, 1979, Pages 431-445

  Dieumegard, D ^a   Dubreuil, D ^a   Amsel, G ^b  

^a Thomson CSF Laboratoire Central de Recherches Domaine de Corbeville 91401 Orsay France ^*

^b ECOLE NORMALE SUPÉRIEURE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000917499     PISSN: 0029554X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0029-554X(79)90532-9     Document Type: Article

References (24)

1. Ranges of 10–30-keV deuterons implanted into solids
2. University of Illinois Report COO-2218-17
3. Large depth profile measurements of D, 3He, and 6Li by deuteron induced nuclear reactions
4. The lateral spread of MeV helium ions in carbon, aluminum, and copper
5. Low energy ion beams 1977
6. Measurement of the Fano factor for protons on silicon
7. Background reduction in D(3He, α)H depth profiling experiments using a simple electrostatic deflector