trans-Diiodobis(triphenylphosphine)-palladium(II)

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 3, 1999, Pages 320-322

  Cave, Gareth W V ^a   Errington, William ^a   Rourke, Jonathan P ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000916319     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198015868     Document Type: Article

References (13)

1. Allen, F. H. & Kennard, O. (1993). Chem. Des. Autom. News, 8, 31-37.
2. Bailey, N. A. & Mason, R (1968). J. Chem. Soc. A, pp. 2594-2605.
3. Cosier, J. & Glazer, A. M. (1986). J. Appl. Cryst. 19, 105-107.
4. Debaerdemaeker, T., Kutoglu, A., Schmid, G. & Weber, L. (1973). Acta Cryst. B29, 1283-1288.
5. Fletcher, D. A., McMeeking, R. F. & Parkin, D. (1996). J. Chem. Inf. Comput. Sci. 36, 746-749.
6. Kubota, M., Ohba, S. & Saito, Y. (1991). Acta Cryst. C47, 1727-1729.
7. Minato, A., Tamao, K., Hayashi, T., Suzuki, K. & Kumada, M. (1980). Tetrahedron Lett. 21, 845-848.
8. Sheldrick, G. M. (1996). SADABS. Empirical Absorption Correction Program. University of Göttingen, Germany.
9. Sheldrick, G. M. (1997). SHELXL97. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
10. Siemens (1994a). SMART Software Reference Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
11. Siemens (1994b). SHELXTL/PC Reference Manual. Version 5.0. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
12. Siemens (1995). SAINT Software Reference Manual. Version 4. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
13. Spek, A. L. (1998). PLATON for Windows. University of Utrecht, The Netherlands.