-
2
-
-
0025576799
-
The impact of non-equilibrium transport on breakdown and transit time in bipolar transistors
-
E. F. Crabbè, J. M. C. Stork, G. Baccarani, M. V. Fischetti, and S. E. Laux, “The impact of non-equilibrium transport on breakdown and transit time in bipolar transistors,” in IEEE IEDM Tech. Dig., pp. 463–466, 1990.
-
(1990)
IEEE IEDM Tech. Dig.
, pp. 463-466
-
-
Crabbè, E.F.1
Stork, J.M.C.2
Baccarani, G.3
Fischetti, M.V.4
Laux, S.E.5
-
3
-
-
84954108170
-
Non-local impact ionization in silicon devices
-
J. W. Slotboom, G. Streutker, M. J. V. Dort, P. H. Woerlee, A. Pruijmboom, and D. J. Gravesteijn, “Non-local impact ionization in silicon devices,” in IEEE IEDM Tech. Dig., pp. 127–130, 1991.
-
(1991)
IEEE IEDM Tech. Dig.
, pp. 127-130
-
-
Slotboom, J.W.1
Streutker, G.2
Dort, M.J.V.3
Woerlee, P.H.4
Pruijmboom, A.5
Gravesteijn, D.J.6
-
4
-
-
85067403069
-
Measurements and simulation of avalanche breakdown in advanced Si bipolar transistors
-
E. Zanoni. E. F. Crabbe, J. M. Stork, P. Pavan, G. Verzellesi, L. Vendrame, and C. Canali, “Measurements and simulation of avalanche breakdown in advanced Si bipolar transistors,” in IEEE IEDM Tech. Dig., pp. 927–930, 1992.
-
(1992)
IEEE IEDM Tech. Dig.
, pp. 927-930
-
-
Zanoni, E.1
Crabbe, E.F.2
Stork, J.M.3
Pavan, P.4
Verzellesi, G.5
Vendrame, L.6
Canali, C.7
-
5
-
-
0023326943
-
Physical modeling of high-current transients for bipolar transistor circuit simulation
-
Apr.
-
H. Jeong and J. G. Fossum, “Physical modeling of high-current transients for bipolar transistor circuit simulation,” IEEE Trans. Electron Devices. vol. ED-34. pp.898–905. Apr. 1987.
-
(1987)
IEEE Trans. Electron Devices.
, vol.ED-34
, pp. 898-905
-
-
Jeong, H.1
Fossum, J.G.2
-
6
-
-
84957332377
-
A physical SiGe-base HBT model for circuit simulation and design
-
G.-B. Hong, J. G. Fossum, and M. Ugajin, “A physical SiGe-base HBT model for circuit simulation and design,” in IEEE IEDM Tech. Dig., pp. 577–580. 1992.
-
(1992)
IEEE IEDM Tech. Dig.
, pp. 577-580
-
-
Hong, G.-B.1
Fossum, J.G.2
Ugajin, M.3
-
7
-
-
84948611866
-
Modeling, Simulation, and Design of SiGe-base hetero- junction bipolar transistors for high-performance integrated circuits
-
Ph.D. dissertation, University of Florida, Gainesville
-
G.-B. Hong, “Modeling, Simulation, and Design of SiGe-base hetero- junction bipolar transistors for high-performance integrated circuits,” Ph.D. dissertation, University of Florida, Gainesville, 1994.
-
(1994)
-
-
Hong, G.-B.1
-
8
-
-
0025502569
-
MMSPICE: A semi- numerical mixed-mode device/circuit simulator for advanced bipolar technology CAD
-
Oct.
-
H. Jeong, J. G. Fossum, and D. K. FitzPatrick, “MMSPICE: A semi- numerical mixed-mode device/circuit simulator for advanced bipolar technology CAD,” Solid-State Electron. vol. 33, pp. 1283–1291, Oct. 1990.
-
(1990)
Solid-State Electron.
, vol.33
, pp. 1283-1291
-
-
Jeong, H.1
Fossum, J.G.2
FitzPatrick, D.K.3
-
9
-
-
33746013210
-
A charge-based large-signal bipolar transistor model for device and circuit simulation
-
Jan.
-
H. Jeong and J. G. Fossum, “A charge-based large-signal bipolar transistor model for device and circuit simulation,” IEEE Trans. Electron Devices, vol. 36, pp. 124–131, Jan. 1989.
-
(1989)
IEEE Trans. Electron Devices
, vol.36
, pp. 124-131
-
-
Jeong, H.1
Fossum, J.G.2
-
11
-
-
0023564797
-
MOSAIC III-A high performance bipolar technology with advanced self-aligned devices
-
P. J. Zdebel, R. J. Balda, B.-Y. Hwang, V. D. J. Torre, and A. Wagner, “MOSAIC III-A high performance bipolar technology with advanced self-aligned devices,” in IEEE BCTM Proc., pp. 172–175, 1987.
-
(1987)
IEEE BCTM Proc.
, pp. 172-175
-
-
Zdebel, P.J.1
Balda, R.J.2
Hwang, B.-Y.3
Torre, V.D.J.4
Wagner, A.5
-
12
-
-
0042817018
-
Epitaxial-base transistors with ultrahigh vacuum chemical vapor deposition (UHV /CVD) epitaxy: Enhanced profile control for greater flexibility in device design
-
Apr.
-
D. L. Harame, J. M. C. Stork, B. S. Meyerson, T. N. Nguyen, and G. J. Scilla, “Epitaxial-base transistors with ultrahigh vacuum chemical vapor deposition (UHV /CVD) epitaxy: Enhanced profile control for greater flexibility in device design,” IEEE Electron Device Lett., vol. 10, pp. 156–158, Apr. 1989.
-
(1989)
IEEE Electron Device Lett.
, vol.10
, pp. 156-158
-
-
Harame, D.L.1
Stork, J.M.C.2
Meyerson, B.S.3
Nguyen, T.N.4
Scilla, G.J.5
-
14
-
-
0346955939
-
Defects in epitaxial multilayers
-
J. W. Matthews and A. E. Blakeslee, “Defects in epitaxial multilayers,” J. Crystal Growth, vol. 27, pp. 118–125, 1974.
-
(1974)
J. Crystal Growth
, vol.27
, pp. 118-125
-
-
Matthews, J.W.1
Blakeslee, A.E.2
-
15
-
-
0027877999
-
Optimization of SiGe HBT technology for high speed analog and mixed-signal applications
-
D. L. Harame, J. M. C. Stork, B. S. Meyerson, K.Y.-J. Hsu, J. Coffe, K. A. Jenkins, J. D. Cressler, P. Restle, E. F. Crabbé, S. Subbanna, T. E. Tice, B. W. Scharf, and J. A. Yasaitis, “Optimization of SiGe HBT technology for high speed analog and mixed-signal applications,” in IEEE IEDM Tech. Dig., pp. 71–74, 1993.
-
(1993)
IEEE IEDM Tech. Dig.
, pp. 71-74
-
-
Harame, D.L.1
Stork, J.M.C.2
Meyerson, B.S.3
Hsu, K.Y.-J.4
Coffe, J.5
Jenkins, K.A.6
Cressler, J.D.7
Restle, P.8
Crabbé, E.F.9
Subbanna, S.10
Tice, T.E.11
Scharf, B.W.12
Yasaitis, J.A.13
-
17
-
-
0028378660
-
Inverse base-width modulation and collector space-charge-region widening: Degrading effects at high current densities in highly scaled BJT's (and HBT’s)
-
Feb.
-
M. Ugajin, G.-B. Hong, and J. G. Fossum, “Inverse base-width modulation and collector space-charge-region widening: Degrading effects at high current densities in highly scaled BJT's (and HBT’s),” IEEE Trans. Electron Devices, vol. 41, pp. 266–268, Feb. 1994.
-
(1994)
IEEE Trans. Electron Devices
, vol.41
, pp. 266-268
-
-
Ugajin, M.1
Hong, G.-B.2
Fossum, J.G.3
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