Advances in surface-light-scattering instrumentation and analysis: Noninvasive measuring of surface tension, viscosity, and other interfacial parameters

Applied Optics

Volumn 40, Issue 24, 2001, Pages 4113-4133

  Meyer, William V ^a   Wegdam, Gerard H ^b   Fenistein, Denis ^b   Mann, J Adin ^c  

^a NASA GLENN RESEARCH CENTER   (United States)

^b UNIVERSITY OF AMSTERDAM   (Netherlands)

^c Case Western Reserve University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SOFTWARE; FOURIER OPTICS; FUNCTIONS; INTERFACES (MATERIALS); SURFACE TENSION; VISCOSITY OF LIQUIDS;

INTERFACIAL TENSION;

LIGHT SCATTERING;

EID: 0000913875     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.004113     Document Type: Article

References (16)

1. L. Lading, J. A. Mann, Jr., and R. V. Edwards, “Analysis of a surface-scattering spectrometer,” J. Opt. Soc. Am. A 6, 1692-1701 (1989).
2. W. V. Meyer, J. A. Lock, H. M. Cheung, T. W. Taylor, P. Tin, and J. A. Mann, Jr., “A hybrid reflection-transmission surface light scattering instrument with reduced sensitivity to surface sloshing,” Appl. Opt. 36, 7605-7614 (1997).
3. J. W. Goodman, Introduction to Fourier Optics, McGraw-Hill Classic Textbook Reissue Series (McGraw-Hill, New York, 1968), p. 287.
4. J. A. Mann, Jr., “Surface light scattering spectroscopy,” in Proceedings of the NATO Advanced Research Workshop on Light Scattering and Photon Correlation Spectroscopy, Vol. 40 of NATO ASI Series, 3. High Technology, E. R. Pike and J. B. Abbiss, eds. (Kluwer, Dordrecht, 1997), p. 97-115.
5. D. Fenistein, G. H. Wegdam, W. V. Meyer, and J. A. Mann, Jr., “Capillary waves on an asymmetric liquid film of pentane on water,” Appl. Opt. 40, 4134-4139 (2001).
6. J. A. Mann, Jr., P. D. Crouser, and W. V. Meyer, “Surface fluctuation spectroscopy by surface-light-scattering spectros-copy,” Appl. Opt. 40, 4092-4112 (2001).
7. D. Langevin, ed., Light Scattering by Liquid Surfaces and Complementary Techniques, 1st ed., Vol. 41 of Surfactant Science Series, M. J. Schick and F. M. Fowkes, eds. (Marcel Dek-ker, New York, 1992).
8. A. E. Smart, R. V. Edwards, and W. V. Meyer, “Quantitative simulation of errors in correlation analysis,” Appl. Opt. 40, 4064-4078 (2001).
9. J. A. Mann, Jr., “Dynamics, structure and function of interfa-cial regions,” Langmuir 1, 10-23 (1985).
10. R. S. Hansen and J. A. Mann, Jr., “Propagation characteristics of capillary waves,” J. Appl. Phys. 35, 152-158 (1964).
11. W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes in C. The Art of Scientific Computing, 2nd ed. (Cambridge U. Press, Cambridge, UK, 1999).
12. M. Abramowitz and I. A. Stegun, eds., Handbook of Mathe-matical Functions (Dover, New York, 1972).
13. C. L. Yaws, “Library of physico-chemical-property data,” in Handbook ofViscosity (Gulf, Houston, Tex., 1997). Note that other literature values for acetone indicate that the correction shown below is needed for the exponent for the Yaws acetone surface tension extrapolation formula
14. R. V. Edwards, R. S. Sirohi, J. A. Mann, Jr., L. B. Shih, and L. Lading, “Surface fluctuation scattering using grating hetero-dyne spectroscopy,” Appl. Opt. 21, 3555-3568 (1982).
15. R. V. Edwards, Case Western Reserve University, Cleveland, Ohio (personal communication, 1985).
16. E. O. Brigham, The Fast Fourier Transform (Prentice-Hall, Englewood Cliffs, N.J., 1974).