Single-Wall Carbon Nanotubes under High Pressures to 62 GPa Studied Using Designer Diamond Anvils

Journal of Nanoscience and Nanotechnology

Volumn 1, Issue 2, 2001, Pages 143-147

  Patterson, Jeremy R ^a   Vohra, Yogesh K ^a   Weir, Samuel T ^b   Akella, Jagannadham ^b  

^a UNIVERSITY OF ALABAMA AT BIRMINGHAM   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Diamond; Diamond Anvils; Electrical Resistance; Hardness; High Pressure; Nanoindentation; Nanotubes

Indexed keywords

CARBON NANOTUBE; DIAMOND;

ARTICLE; CHEMISTRY; COMPARATIVE STUDY; CONFORMATION; CRYSTALLIZATION; ELECTROCHEMISTRY; ELECTRODE; EVALUATION; HARDNESS; IMPEDANCE; INSTRUMENTATION; ISOLATION AND PURIFICATION; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PRESSURE; SURFACE PROPERTY;

CRYSTALLIZATION; DIAMOND; ELECTRIC IMPEDANCE; ELECTROCHEMISTRY; ELECTRODES; HARDNESS; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES, CARBON; PRESSURE; SURFACE PROPERTIES;

EID: 0000913328     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2001.026     Document Type: Article

References (17)

1. V. D. Blank, S. G. Buga, G. A. Dubitsky, N. R. Serebryanaya, M. Yu. Popov, and B. Sundquist, Carbon 36, 319 (1998).
2. A. G. Lyapin, V. V. Brazhkin, E. L. Gromnitskaya, S. V. Popova, O. V. Stal'gorova, R. N. Voloshin, S. C. Bayliss, and A. V. Sapelkin, Appl. Phys. Lett. 76, 712 (2000).
3. V. Blank, M. Popov, G. Pivovarov, N. Lvova, K. Gogolinsky, and V. Reshetov, Diamond Relat. Mater. 7, 427 (1998).
4. J. R. Patterson, S. A. Catledge, Y. K. Vohra, J. Akella, and S. T. Weir, Phys. Rev. Lett. 85, 5354 (2000).
5. A. D. Bozhko, D. E. Sklovsky, V. A. Nalimova, A. G. Rinzler, R. E. Smalley, and J. E. Fisher, Appl. Phys. A 67, 75 (1998).
6. U. D. Venkateswaran, E. A. Brandsen, U. Schlecht, A. M. Rao, E. Richter, I. Loa, K. Syassen, and P. C. Eklund, Phys. Status Solidii (b) 223, 225 (2001).
7. D. S. Tang, Z. X. Bao, L. J. Wang, L. C. Chen, L. F. Sun, Z. Q. Liu, W. Y. Zhou, and S. S. Xie, J. Phys. Chem. Solids 61, 1175 (2000).
8. T. S. McCauley and Y. K. Vohra, Appl. Phys. Lett. 66, 1486 (1995).
9. S. A. Catledge, Y. K. Vohra, S. T. Weir, and J. Akella, J. Phys.: Condens. Matter 9, L67-L73 (1997).
10. S. T. Weir, J. Akella, C. A. Ruddle, Y. K. Vohra, and S. A. Catledge, Appl. Phys. Lett. 77, 3400 (2000).
11. J. W. G. Wildoer, L. C. Venema, A. G. Rinzler, R. E. Smalley, and C. Dekker, Nature, 391, 59 (2000).
12. J. C. Charlier, J. Mater. Res. 13, 2368 (1998).
13. K. Suenaga, C. Colliex, and S. Iijima, Appl. Phys. Lett. 78, 70 (2001).
14. L. Yang and J. Han, Phys. Rev. Lett. 85, 154 (2000).
15. M. Takizawa, S. Bandow, M. Yudasaka, Y. Ando, H. Shimoyama, and S. Iijima, Chem. Phys. Lett. 326, 351 (2000).
16. A. Kasuya, Y. Sasaki, Y. Saito, K. Tohji, and Y. Nishina, Phys. Rev. Lett. 78, 4434 (1997).
17. W. C. Oliver and G. M. Pharr, J. Mater. Res. 7, 1564 (1992).