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Volumn 60, Issue 18, 1999, Pages R12565-R12568

Infrared probe of the electronic structure and carrier scattering in nimnsb thin films

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EID: 0000910826     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.R12565     Document Type: Article
Times cited : (38)

References (27)
  • 24
    • 85037923029 scopus 로고    scopus 로고
    • The point-contact spectroscopy technique actually measures, in the limit of ballistic transport, a spin polarization at (Formula presented) given by (Formula presented) which is weighted by the relative Fermi velocities (Formula presented) for spin-up and spin-down electrons as opposed to the unweighted P relevant to the present analysis. The level of the pseudogap in (Formula presented) [dashed line in inset to Fig. 33(a)] is set to give simply (Formula presented) at (Formula presented) neglecting the Fermi velocity weighting for now.
    • The point-contact spectroscopy technique actually measures, in the limit of ballistic transport, a spin polarization at (Formula presented) given by (Formula presented) which is weighted by the relative Fermi velocities (Formula presented) for spin-up and spin-down electrons as opposed to the unweighted P relevant to the present analysis. The level of the pseudogap in (Formula presented) [dashed line in inset to Fig. 33(a)] is set to give simply (Formula presented) at (Formula presented) neglecting the Fermi velocity weighting for now.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.