Electrical characterization of the β-FeSi2/Si heterojunction after thermal oxidation

Applied Physics Letters

Volumn 68, Issue 1, 1996, Pages 105-107

  Erlesand, U ^a   Ostling M ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000905445     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116770     Document Type: Article

References (23)

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