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Volumn 88, Issue 2, 2000, Pages 829-837

Monte Carlo evaluations of degeneracy and interface roughness effects on electron transport in AlGaN-GaN heterostructures

(3) Li, T a Joshi, R P a Fazi, C b

a Old Dominion University (United States)

b U S ARMY RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000899043 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.373744 Document Type: Review

Times cited : (50)

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